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Make C++ test names more consistent (#3586)

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Inconsistent names were found using the following regular expressions.

* `rg "TEST(_F|_P)?\(\w+,\s+\w+Test\)"`
* `rg "TEST(_F|_P)?\(\w+,\s+Test\w+\)"`
* `rg "TEST(_F|_P)?\(\w+Tests,\s+\w+\)"`

Fixes #3495.
This commit is contained in:
Tyler Veness
2021-09-17 22:51:51 -07:00
committed by GitHub
parent 5c88685495
commit fe59e4b9fe
73 changed files with 189 additions and 189 deletions
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18
crossConnIntegrationTests/src/main/native/cpp/AnalogTests.cpp → crossConnIntegrationTests/src/main/native/cpp/AnalogTest.cpp
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@@ -14,7 +14,7 @@ using namespace hlt;
class AnalogCrossTest : public ::testing::TestWithParam<std::pair<int, int>> {};
TEST_P(AnalogCrossTest, TestAnalogCross) {
TEST_P(AnalogCrossTest, AnalogCross) {
auto param = GetParam();
int32_t status = 0;
@@ -40,7 +40,7 @@ TEST_P(AnalogCrossTest, TestAnalogCross) {
}
}
TEST(AnalogInputTest, TestAllocateAll) {
TEST(AnalogInputTest, AllocateAll) {
wpi::SmallVector<AnalogInputHandle, 21> analogHandles;
for (int i = 0; i < HAL_GetNumAnalogInputs(); i++) {
int32_t status = 0;
@@ -49,7 +49,7 @@ TEST(AnalogInputTest, TestAllocateAll) {
}
}
TEST(AnalogInputTest, TestMultipleAllocateFails) {
TEST(AnalogInputTest, MultipleAllocateFails) {
int32_t status = 0;
AnalogInputHandle handle(0, &status);
ASSERT_NE(handle, HAL_kInvalidHandle);
@@ -60,21 +60,21 @@ TEST(AnalogInputTest, TestMultipleAllocateFails) {
ASSERT_LAST_ERROR_STATUS(status, RESOURCE_IS_ALLOCATED);
}
TEST(AnalogInputTest, TestOverAllocateFails) {
TEST(AnalogInputTest, OverAllocateFails) {
int32_t status = 0;
AnalogInputHandle handle(HAL_GetNumAnalogInputs(), &status);
ASSERT_EQ(handle, HAL_kInvalidHandle);
ASSERT_LAST_ERROR_STATUS(status, RESOURCE_OUT_OF_RANGE);
}
TEST(AnalogInputTest, TestUnderAllocateFails) {
TEST(AnalogInputTest, UnderAllocateFails) {
int32_t status = 0;
AnalogInputHandle handle(-1, &status);
ASSERT_EQ(handle, HAL_kInvalidHandle);
ASSERT_LAST_ERROR_STATUS(status, RESOURCE_OUT_OF_RANGE);
}
TEST(AnalogOutputTest, TestAllocateAll) {
TEST(AnalogOutputTest, AllocateAll) {
wpi::SmallVector<AnalogOutputHandle, 21> analogHandles;
for (int i = 0; i < HAL_GetNumAnalogOutputs(); i++) {
int32_t status = 0;
@@ -83,7 +83,7 @@ TEST(AnalogOutputTest, TestAllocateAll) {
}
}
TEST(AnalogOutputTest, TestMultipleAllocateFails) {
TEST(AnalogOutputTest, MultipleAllocateFails) {
int32_t status = 0;
AnalogOutputHandle handle(0, &status);
ASSERT_NE(handle, HAL_kInvalidHandle);
@@ -94,14 +94,14 @@ TEST(AnalogOutputTest, TestMultipleAllocateFails) {
ASSERT_LAST_ERROR_STATUS(status, RESOURCE_IS_ALLOCATED);
}
TEST(AnalogOutputTest, TestOverAllocateFails) {
TEST(AnalogOutputTest, OverAllocateFails) {
int32_t status = 0;
AnalogOutputHandle handle(HAL_GetNumAnalogOutputs(), &status);
ASSERT_EQ(handle, HAL_kInvalidHandle);
ASSERT_LAST_ERROR_STATUS(status, RESOURCE_OUT_OF_RANGE);
}
TEST(AnalogOutputTest, TestUnderAllocateFails) {
TEST(AnalogOutputTest, UnderAllocateFails) {
int32_t status = 0;
AnalogOutputHandle handle(-1, &status);
ASSERT_EQ(handle, HAL_kInvalidHandle);

12
crossConnIntegrationTests/src/main/native/cpp/DIOTests.cpp → crossConnIntegrationTests/src/main/native/cpp/DIOTest.cpp
View File

@@ -13,7 +13,7 @@ using namespace hlt;
class DIOTest : public ::testing::TestWithParam<std::pair<int, int>> {};
TEST_P(DIOTest, TestDIOCross) {
TEST_P(DIOTest, DIOCross) {
auto param = GetParam();
int32_t status = 0;
DIOHandle first{param.first, false, &status};
@@ -53,7 +53,7 @@ TEST_P(DIOTest, TestDIOCross) {
ASSERT_EQ(0, status);
}
TEST(DIOTest, TestAllocateAll) {
TEST(DIOTest, AllocateAll) {
wpi::SmallVector<DIOHandle, 32> dioHandles;
for (int i = 0; i < HAL_GetNumDigitalChannels(); i++) {
int32_t status = 0;
@@ -62,7 +62,7 @@ TEST(DIOTest, TestAllocateAll) {
}
}
TEST(DIOTest, TestMultipleAllocateFails) {
TEST(DIOTest, MultipleAllocateFails) {
int32_t status = 0;
DIOHandle handle(0, true, &status);
ASSERT_NE(handle, HAL_kInvalidHandle);
@@ -73,21 +73,21 @@ TEST(DIOTest, TestMultipleAllocateFails) {
ASSERT_LAST_ERROR_STATUS(status, RESOURCE_IS_ALLOCATED);
}
TEST(DIOTest, TestOverAllocateFails) {
TEST(DIOTest, OverAllocateFails) {
int32_t status = 0;
DIOHandle handle(HAL_GetNumDigitalChannels(), true, &status);
ASSERT_EQ(handle, HAL_kInvalidHandle);
ASSERT_LAST_ERROR_STATUS(status, RESOURCE_OUT_OF_RANGE);
}
TEST(DIOTest, TestUnderAllocateFails) {
TEST(DIOTest, UnderAllocateFails) {
int32_t status = 0;
DIOHandle handle(-1, true, &status);
ASSERT_EQ(handle, HAL_kInvalidHandle);
ASSERT_LAST_ERROR_STATUS(status, RESOURCE_OUT_OF_RANGE);
}
TEST(DIOTest, TestCrossAllocationFails) {
TEST(DIOTest, CrossAllocationFails) {
int32_t status = 0;
PWMHandle pwmHandle(10, &status);
ASSERT_NE(pwmHandle, HAL_kInvalidHandle);

2
crossConnIntegrationTests/src/main/native/cpp/DutyCycleTests.cpp → crossConnIntegrationTests/src/main/native/cpp/DutyCycleTest.cpp
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@@ -12,7 +12,7 @@ using namespace hlt;
class DutyCycleTest : public ::testing::TestWithParam<std::pair<int, int>> {};
TEST_P(DutyCycleTest, TestDutyCycle) {
TEST_P(DutyCycleTest, DutyCycle) {
auto param = GetParam();
int32_t status = 0;

22
crossConnIntegrationTests/src/main/native/cpp/PWMTests.cpp → crossConnIntegrationTests/src/main/native/cpp/PWMTest.cpp
View File

@@ -279,37 +279,37 @@ void TestTiming(int squelch, std::pair<int, int> param) {
}
}
TEST_P(PWMTest, TestTiming4x) {
TEST_P(PWMTest, Timing4x) {
auto param = GetParam();
TestTiming(3, param);
}
TEST_P(PWMTest, TestTiming2x) {
TEST_P(PWMTest, Timing2x) {
auto param = GetParam();
TestTiming(1, param);
}
TEST_P(PWMTest, TestTiming1x) {
TEST_P(PWMTest, Timing1x) {
auto param = GetParam();
TestTiming(0, param);
}
TEST_P(PWMTest, TestTimingDMA4x) {
TEST_P(PWMTest, TimingDMA4x) {
auto param = GetParam();
TestTimingDMA(3, param);
}
TEST_P(PWMTest, TestTimingDMA2x) {
TEST_P(PWMTest, TimingDMA2x) {
auto param = GetParam();
TestTimingDMA(1, param);
}
TEST_P(PWMTest, TestTimingDMA1x) {
TEST_P(PWMTest, TimingDMA1x) {
auto param = GetParam();
TestTimingDMA(0, param);
}
TEST(PWMTest, TestAllocateAll) {
TEST(PWMTest, AllocateAll) {
wpi::SmallVector<PWMHandle, 21> pwmHandles;
for (int i = 0; i < HAL_GetNumPWMChannels(); i++) {
int32_t status = 0;
@@ -318,7 +318,7 @@ TEST(PWMTest, TestAllocateAll) {
}
}
TEST(PWMTest, TestMultipleAllocateFails) {
TEST(PWMTest, MultipleAllocateFails) {
int32_t status = 0;
PWMHandle handle(0, &status);
ASSERT_NE(handle, HAL_kInvalidHandle);
@@ -329,21 +329,21 @@ TEST(PWMTest, TestMultipleAllocateFails) {
ASSERT_LAST_ERROR_STATUS(status, RESOURCE_IS_ALLOCATED);
}
TEST(PWMTest, TestOverAllocateFails) {
TEST(PWMTest, OverAllocateFails) {
int32_t status = 0;
PWMHandle handle(HAL_GetNumPWMChannels(), &status);
ASSERT_EQ(handle, HAL_kInvalidHandle);
ASSERT_LAST_ERROR_STATUS(status, RESOURCE_OUT_OF_RANGE);
}
TEST(PWMTest, TestUnderAllocateFails) {
TEST(PWMTest, UnderAllocateFails) {
int32_t status = 0;
PWMHandle handle(-1, &status);
ASSERT_EQ(handle, HAL_kInvalidHandle);
ASSERT_LAST_ERROR_STATUS(status, RESOURCE_OUT_OF_RANGE);
}
TEST(PWMTest, TestCrossAllocationFails) {
TEST(PWMTest, CrossAllocationFails) {
int32_t status = 0;
DIOHandle dioHandle(10, true, &status);
ASSERT_NE(dioHandle, HAL_kInvalidHandle);

2
crossConnIntegrationTests/src/main/native/cpp/RelayAnalogTests.cpp → crossConnIntegrationTests/src/main/native/cpp/RelayAnalogTest.cpp
View File

@@ -14,7 +14,7 @@ using namespace hlt;
class RelayAnalogTest : public ::testing::TestWithParam<std::pair<int, int>> {};
TEST_P(RelayAnalogTest, TestRelayAnalogCross) {
TEST_P(RelayAnalogTest, RelayAnalogCross) {
auto param = GetParam();
int32_t status = 0;

10
crossConnIntegrationTests/src/main/native/cpp/RelayDigitalTests.cpp → crossConnIntegrationTests/src/main/native/cpp/RelayDigitalTest.cpp
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@@ -13,7 +13,7 @@ using namespace hlt;
class RelayDigitalTest : public ::testing::TestWithParam<RelayCross> {};
TEST_P(RelayDigitalTest, TestRelayCross) {
TEST_P(RelayDigitalTest, RelayCross) {
auto param = GetParam();
int32_t status = 0;
RelayHandle fwd{param.Relay, true, &status};
@@ -66,7 +66,7 @@ TEST_P(RelayDigitalTest, TestRelayCross) {
ASSERT_EQ(0, status);
}
TEST(RelayDigitalTest, TestAllocateAll) {
TEST(RelayDigitalTest, AllocateAll) {
wpi::SmallVector<RelayHandle, 32> relayHandles;
for (int i = 0; i < HAL_GetNumRelayChannels(); i++) {
int32_t status = 0;
@@ -75,7 +75,7 @@ TEST(RelayDigitalTest, TestAllocateAll) {
}
}
TEST(RelayDigitalTest, TestMultipleAllocateFails) {
TEST(RelayDigitalTest, MultipleAllocateFails) {
int32_t status = 0;
RelayHandle handle(0, true, &status);
ASSERT_NE(handle, HAL_kInvalidHandle);
@@ -86,14 +86,14 @@ TEST(RelayDigitalTest, TestMultipleAllocateFails) {
ASSERT_LAST_ERROR_STATUS(status, RESOURCE_IS_ALLOCATED);
}
TEST(RelayDigitalTest, TestOverAllocateFails) {
TEST(RelayDigitalTest, OverAllocateFails) {
int32_t status = 0;
RelayHandle handle(HAL_GetNumRelayChannels(), true, &status);
ASSERT_EQ(handle, HAL_kInvalidHandle);
ASSERT_LAST_ERROR_STATUS(status, RESOURCE_OUT_OF_RANGE);
}
TEST(RelayDigitalTest, TestUnderAllocateFails) {
TEST(RelayDigitalTest, UnderAllocateFails) {
int32_t status = 0;
RelayHandle handle(-1, true, &status);
ASSERT_EQ(handle, HAL_kInvalidHandle);