mirror of
https://github.com/wpilibsuite/allwpilib
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d6f185d8e5
I started with the output of styleguide#217, then renamed a few classes to fix compilation. ntcore's StorageTest needed some manual renaming since it put the Test word in the middle instead of at the end. One limitation of wpiformat is test cases that were only named "Test" were unmodified, and an error was generated. These test cases were manually given more descriptive names: * TimedRobotTest mode test cases had "Mode" appended to the name. Java tests were renamed to match. * UvAsyncTest and UvAsyncFunctionTest cases were given alternate names
102 lines
2.8 KiB
C++
102 lines
2.8 KiB
C++
// Copyright (c) FIRST and other WPILib contributors.
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// Open Source Software; you can modify and/or share it under the terms of
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// the WPILib BSD license file in the root directory of this project.
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#include <hal/DIO.h>
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#include <wpi/SmallVector.h>
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#include "CrossConnects.h"
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#include "LifetimeWrappers.h"
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#include "gtest/gtest.h"
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using namespace hlt;
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class DIOTest : public ::testing::TestWithParam<std::pair<int, int>> {};
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TEST_P(DIOTest, DIOCross) {
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auto param = GetParam();
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int32_t status = 0;
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DIOHandle first{param.first, false, &status};
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ASSERT_EQ(0, status);
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DIOHandle second{param.second, true, &status};
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ASSERT_EQ(0, status);
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HAL_SetDIO(first, false, &status);
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ASSERT_EQ(0, status);
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usleep(1000);
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ASSERT_FALSE(HAL_GetDIO(first, &status));
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ASSERT_EQ(0, status);
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ASSERT_FALSE(HAL_GetDIO(second, &status));
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ASSERT_EQ(0, status);
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HAL_SetDIO(first, true, &status);
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ASSERT_EQ(0, status);
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usleep(1000);
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ASSERT_TRUE(HAL_GetDIO(second, &status));
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ASSERT_EQ(0, status);
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HAL_SetDIODirection(first, true, &status);
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ASSERT_EQ(0, status);
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HAL_SetDIODirection(second, false, &status);
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ASSERT_EQ(0, status);
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HAL_SetDIO(second, false, &status);
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ASSERT_EQ(0, status);
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usleep(1000);
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ASSERT_FALSE(HAL_GetDIO(first, &status));
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ASSERT_EQ(0, status);
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HAL_SetDIO(second, true, &status);
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ASSERT_EQ(0, status);
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usleep(1000);
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ASSERT_TRUE(HAL_GetDIO(first, &status));
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ASSERT_EQ(0, status);
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}
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TEST(DIOTest, AllocateAll) {
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wpi::SmallVector<DIOHandle, 32> dioHandles;
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for (int i = 0; i < HAL_GetNumDigitalChannels(); i++) {
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int32_t status = 0;
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dioHandles.emplace_back(i, true, &status);
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ASSERT_EQ(status, 0);
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}
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}
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TEST(DIOTest, MultipleAllocateFails) {
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int32_t status = 0;
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DIOHandle handle(0, true, &status);
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ASSERT_NE(handle, HAL_kInvalidHandle);
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ASSERT_EQ(status, 0);
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DIOHandle handle2(0, true, &status);
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ASSERT_EQ(handle2, HAL_kInvalidHandle);
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ASSERT_LAST_ERROR_STATUS(status, RESOURCE_IS_ALLOCATED);
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}
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TEST(DIOTest, OverAllocateFails) {
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int32_t status = 0;
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DIOHandle handle(HAL_GetNumDigitalChannels(), true, &status);
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ASSERT_EQ(handle, HAL_kInvalidHandle);
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ASSERT_LAST_ERROR_STATUS(status, RESOURCE_OUT_OF_RANGE);
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}
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TEST(DIOTest, UnderAllocateFails) {
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int32_t status = 0;
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DIOHandle handle(-1, true, &status);
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ASSERT_EQ(handle, HAL_kInvalidHandle);
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ASSERT_LAST_ERROR_STATUS(status, RESOURCE_OUT_OF_RANGE);
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}
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TEST(DIOTest, CrossAllocationFails) {
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int32_t status = 0;
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PWMHandle pwmHandle(10, &status);
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ASSERT_NE(pwmHandle, HAL_kInvalidHandle);
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ASSERT_EQ(status, 0);
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DIOHandle handle(10, true, &status);
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ASSERT_EQ(handle, HAL_kInvalidHandle);
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ASSERT_LAST_ERROR_STATUS(status, RESOURCE_IS_ALLOCATED);
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}
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INSTANTIATE_TEST_SUITE_P(DIOCrossConnectsTests, DIOTest,
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::testing::ValuesIn(DIOCrossConnects));
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